Title Virtual Performance Centred Environment for Training in Nanoelectronics
Project Number FR/06/B/P/PP-152507
Product Courses "Scanning Force Microscopy"
Title Courses "Scanning Force Microscopy"
Product Type open and distance learning
The course covers the research and innovation in the following major topics:
- Tip-sample interaction at the nanometer scale according to the working environment
- Surface and object characterization by SFM : potential and limitation
- Electrical characterization of thin oxide film and nanoelectronics structures
- SFM probe use as a nanotool to elaborate or modify nanodevices.
Description Objective: The learner will be able to: (1) Select the right scanning force microscopy technique according to the sample specificities and nature and to choose the working mode in function of the characterisation needs; (2) Treat and analyse the SPM data in order to identify the most relevant information and to avoid common artefacts; (3) Inject and/or detect electrical charge in thin oxide film or nanostructure used in nanoeletronics; (4) Use the probe as a nanotool; (5) Follow a practical lab training course on SFM(as e.g. regularly provided by Grenoble university in the Nanoworld platform.
Technicians and Engineers working in the field of electrical engineering, industrial engineering, material science or related fields, master students and PhD students in the fields of electrical engineering, micro & nanotechnology, microelectronics, material science or related topics.
Basic knowledge in solid state physics, Newton’s mechanics, electrical engineering, and material science (Bachelor level or practical working experience).
Estimated duration of the course: about 5x 90 minutes online studies, including exercises
Result tested and implemented
Area of application training organisations, universities, SMEs in micro- nanoelectronics
Product Languages English