Title Virtual Performance Centred Environment for Training in Nanoelectronics
Project Number FR/06/B/P/PP-152507
Product Course "Scanning Tunneling Microscopy"
Title Course "Scanning Tunneling Microscopy"
Product Type material for open learning
Marketing Text Scanning Tunneling Microscopy (STM), developed in 1981 by Binnig and Rohrer at IBM Rüschlikon, is one of the most fascinating technological innovations as it allows to discover the ‘nanoworld’ on an atomic scale. Many of the scientific results show technological impact in the field of nanotechnology for example in the developments of new electronic devices used in the field of micro- and nanoelectronics, such as e.g. thin film transistors for chemical or biosensors. The module STM aims to give an introduction to the powerful characterization tools offered by this scanning probe microscopy method. Aside the underlying physical concepts, the measurement principle, and STM instrumentation, the module focuses on STM applications in surface analysis and the topographic and electronic characterization of nanoscale components, as well as on scientific research examples oriented towards molecular electronics.
- Introduction to scanning tunneling microscopy
Measurement principles, theoretical description of quantum mechanical tunneling (including exercises), tunnel barrier, tunneling current (tunneling regime and field emission regime), atomic resolution of monatomic steps, lateral atomic resolution, history of technical developments, some examples on modern applications
- Methods of tip and sample preparation
tip materials, preparation methods, examples of sample materials and their methods of preparations in air and in ultrahigh vacuum (UHV)
- STM tip-positioning
Technical requirements for tip-positioning, inverse piezoelectric effect, short overview over piezoelectric materials, hysteresis of piezos, references to electronic circuits for piezos
- Signal detection and feedback-loop
Detection of tunnel current, references to electronic circuits for tunnel current amplifiers, low noise I-U converters, feedback loop, role of the gain
- Common artifacts:
the role of the tip, typical artifacts in images with “bad tips”, artifacts due to piezo hysteresis
- Scanning tunneling spectroscopy, electronic structure and STM data interpretation
Chemical imaging, spectroscopic modes in STM: measurement principle, technical requirements, advantages/disadvantages of different spectroscopic modes and the information gained: knowledge about electronic structure => examples for data interpretation in case of semiconductors, ultrathin insulators, adsorbed molecules, supraconductors, ...
- Applications of STM in the fields of micro and nanoelectronics and from research towards molecular electronics
Estimated duration: about 5 x 90 minutes online studies, including exercises
Target group Engineers working in the field of electrical engineering, industrial engineering, material science or related fields, master students and PhD students in the fields of electrical engineering, micro & nanotechnology, microelectronics, material science or related topics.
Result tested and implemented
Area of application training organisations, universities, SMEs in micro- nanoelectronics
Product Languages English