Title Modular teaching and learning offers for contemporary and needed further education
Project Number D/04/B/F/PP-146 157
Product Failure Mechanism and Reliability in Electronics - Failures Testing Methodology
Title Failure Mechanism and Reliability in Electronics - Failures Testing Methodology
Product Type modules
The methodology module clarifies testing procedures and chronological succession of testing/measurement steps in practice. It takes note of the fact that accelerated test methods represent the quickest and the cheapest way to anticipated results – final quality and reliability assessment. It describes necessary assumptions and testing conditions for testing and measurement.
Target group Workers in SME, trainers from various area of industry, high school teachers
Ageing of electronic systems and elements generally is represented by summary of physical and chemical processes that are going on in used materials during their operational lifetime that brings about irreversible changes of their functional characteristics. Rapidity of those processes can be therefore considered as rapidity of ageing and through them ageing can be influenced (accelerated), in order to gain reliability parameters. Long time period is necessary for implementation of standard reliability tests that in practice do not allow feedback and potential intervention to technological process in actual time. Therefore, long-time tests are replaced in practice by speeded up tests. Appraisal of those tests allows predicting parameters from viewpoint of long term reliability.
Methodology of speeded up testing is based on a precondition that ageing is represented by sum of simple physical and chemical processes and that thermal degradation is guided by the “Arrheniu’s Principle”. Such tests are then considered as speeded up tests during which is speeded up known mechanism of failures, for example by rising up of performance loading or environmental temperature of analyzed elements, in comparison to their standard operational environment.
Generally, from speeded up tests is expected that, by analysis of a particular behaviour of a certain set of elements of the same type that are exposed to higher strain, it will be possible to predict time sequence of monitored parameters in standard conditions. Purpose of speeded up tests can also be comparison of sequence of monitored parameters of two or more doses of similar electronic elements, or comparison of elements where construction or technology changes were made, to components where changes were not executed. Speeded up tests also allow to express from production dose elements that are burdened by production faults, and so elements potentially not reliable.
Methodology of speeded up tests is based on stricter failure criteria, their exact definition and adequate rise of applicable strain. Degree of risen up strain is necessary to select carefully since not adequate strain may, in significant way, change degradation mechanisms.
Area of application
secondary school, bachelor and master degree
CD, WEB site, word, Power point
http://www.microteaching.org/on line, of line, E learning
Product Languages German